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Labsphere and Otsuka Launch HalfMoon
Light Measurement System

Total forward spectral flux measurement systems deliver full integrating sphere accuracy in compact design

Labsphere Press Release - 1/6/2009
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HalfMoon Total Forward Spectral Flux Measurement System

HalfMoon Total Forward Spectral Flux Measurement System

NORTH SUTTON, N.H. - Labsphere, a world leader in light testing and measurement and optical coatings, and Otsuka Electronics Co., Ltd of Japan have collaborated to develop a new light measurement system. Designed for manufacturers of LEDs, light fixtures and displays, the HalfMoon Total Forward Spectral Flux Measurement Systems deliver accurate and efficient light source measurements.

Available in standard 12, 20 and 40 inch diameters, the HalfMoon system provides an alternative to integrating sphere photometer and goniophotometer methods of measuring total forward spectral flux of forward emitting lamps, luminaires and displays. The unique compact design, available only from Labsphere and Otsuka, creates a virtual integrating sphere by pairing an interior mirrored surface cap with half an orb coated with Labsphere's highly reflective diffuse Spectraflect® material. The resulting system saves space, minimizes absorption errors and facilitates quick sample changes.

While the HalfMoon has a small footprint, it shares the accuracy of an integrating sphere, but with twice the efficiency of an integrating sphere of the same diameter. The center sample mounting keeps base electronics and thermal management peripherals out of the detection area to reduce absorption errors. The easily accessible mount also reduces the time to set up and change samples for measurement. The system is configured for base up to horizontal measurement geometry, allowing products to be tested in the same orientation as the fixtures they are intended for.

Part of the global Halma group of technology companies, Labsphere is a world leader in light testing and measurement and diffuse optical coatings. The company's products include LED, laser and traditional light source light measurement systems; uniform light sources for imaging device calibration; spectroscopy accessories; and high diffuse reflectance materials and coatings for applications in backlit panel displays, computed radiography, and system calibration. The company's expertise has resulted in multiple patents in areas such as methods for testing LEDs on a wafer and UV transmittance.

For more information, visit the company's website at:

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